Part Number Hot Search : 
02001 HALB815E 3843AM C1010 SEEVG HI3276 SAF3560 A1006
Product Description
Full Text Search
 

To Download ICSSSTUA32S869B Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 Integrated Circuit Systems, Inc.
ICSSSTUA32S869B Advance Information
14-Bit Configurable Registered Buffer for DDR2
Recommended Application: * DDR2 Memory Modules * Provides complete DDR DIMM solution with ICS97U877 * Ideal for DDR2 400, 533 and 667 Product Features: * 14-bit 1:2 registered buffer with parity check functionality * Supports SSTL_18 JEDEC specification on data inputs and outputs * 50% more dynamic driver strength than standard SSTU32864 * Supports LVCMOS switching levels on C1 and RESET# inputs * Low voltage operation VDD = 1.7V to 1.9V * Available in 150 BGA package * Green packages available
Pin Configuration
1 A B C D E F G H J K L M N P R T U V W 2 3 4 5 6 7 8 9 10 11
150 Ball BGA (Top View) Functionality Truth Table
Inputs RESET# H H H H H H H H H H H H L DCS# L L L L L L H H H H H H X or floating CSR# L L L H H H L L L H H H X or floating CK CK# Dn, DODT, DCKE L H X L H X L H X L H X X or floating Qn L H Q0 L H Q0 L H Q0 Q0 Q0 Q0 L Outputs QCS# L L Q0 L L Q0 H H Q0 H H Q0 L QODT, QCKE L H Q0 L H Q0 L H Q0 L H Q0 L

L or H

L or H

L or H

L or H

L or H

L or H

L or H X or floating

L or H X or floating
1173--10/28/05
ADVANCE INFORMATION documents contain information on products in the formative or design phase development. Characteristic data and other specifications are design goals. ICS reserves the right to change or discontinue these products without notice. Third party brands and names are the property of their respective owners.
ICSSSTUA32S869B Advance Information
Ball Assignments
1 A B C D E F G H J K L M N P R T U V
NB VDD QCKEA Q2A Q3A QODTA Q5A Q6A
2
VDD NB VDD VDD VDD VDD VDD NB
3
MCL(1) VDD NB GND NB GND GND GND
4
NC GND GND NB D3 NB D5 NB
5
GND GND NB DCKE NB NC NB NC
6
VREF GND GND NB NC NB CLK NB
7
GND GND NB D2 NB NC NB NC
8
NC GND GND NB DODT NB D6 NB
9
MCL(1) VDD NB GND NB GND GND GND
10
VDD NB VDD VDD NC VDD VDD NB
11
NC VDD QCKEB Q2B Q3B QODTB Q5B Q6B
QCSA#
VDD Q8A Q9A Q10A Q11A Q12A Q13A Q14A VDD
VDD
VDD VDD NB VDD VDD C1 VDD VDD NB
NB
GND NB GND GND GND NB GND NB VDD
NC
GND DCS# NB D9 NB D11 NB GND GND PARIN1
NB
NB NB NC NB NC NB D13 NB GND GND
RESET#
NB CLK# NB NC NB NC NB GND GND VREF
NB
NB NB NC NB NC NB D14 NB GND GND
CSR#
GND D8 NB D10 NB D12 NB GND GND PPO1
NB
VDD NB GND GND GND NB GND NB VDD MCL(1)
VDD
VDD VDD NB VDD VDD VDD VDD VDD NB VDD
QCSB#
VDD Q8B Q9B Q10B Q11B Q12B Q13B Q14B VDD NB
W P TYERR1#
VDD
MCL(1)
Note: NC denotes a no-connect (ball present but not connected to the die). NB indicates no ball is populated at that gridpoint.
1173--10/28/05
2
ICSSSTUA32S869B Advance Information
Parity and Standby Function Table
Inputs RESET# H H H H H H H H H H L DCS# L L L L L L L L H X X or floating CSR# X X X X L L L L H X X or floating CK L or H X or floating CK# L or H X or floating of inputs = H D1..... (1) D14 Even Odd Even Odd Even Odd Even Odd X X X or floating PARIN1(2) L L H H L L H H X X X or floating PPO1(2) L H H L L H H L PPOn0 PPOn0 L Output PTYERR1#(3) H L L H H L L H PTYERRn0# PTYERRn0# H
NOTE 1 Inputs D1, D4 and D4 are not included in this range. NOTE 2 PARIN1 arrives one (C1 = 0) or two (C = 1) clock cycles after data to which it applies. NOTE 3 This transition assumes PTYERR1# is high at the crossing of CK going high and CK# going low. If PTYERR1# is low, it stays latched low for two clock cycles or until RESET# is driven low. PARIN1 is used to generate PPO1 and PTYERR1#.
1173--10/28/05
3
ICSSSTUA32S869B Advance Information
General Description
The ICSSSTUA32S869B is 14-bit 1:2 registered buffer with parity is designed for 1.7 V to 1.9 V VDD operation. All clock and data inputs are compatible with the JEDEC standard for SSTL_18. The control inputs are LVCMOS. All outputs are 1.8 V CMOS drivers optimized to drive the DDR2 DIMM load. They provide 50% more dynamic driver strength than the standard SSTU32864 outputs. The ICSSSTUA32S869B operates from a differential clock (CK and CK). Data are registered at the crossing of CK going high, and CK going low. The device supports low-power standby operation. When the reset input (RESET) is low, the differential input receivers are disabled, and undriven (floating) data, clock and reference voltage (VREF) inputs are allowed. In addition, when RESET is low all registers are reset, and all outputs except PTYERR1# are forced low. The LVCMOS RESET input must always be held at a valid logic high or low level. To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in the low state during power up. In the DDR2 RDIMM application, RESET is specified to be completely asynchronous with respect to CK and CK. Therefore, no timing relationship can be guaranteed between the two. When entering reset, the register will be cleared and the outputs will be driven low quickly, relative to the time to disable the differential input receivers. However, when coming out of reset, the register will become active quickly, relative to the time to enable the differential input receivers. ICSSSTUA32S869B must ensure that the outputs remain low as long as the data inputs are low, the clock is stable during the time from the low-to-high transition of RESET and the input receivers are fully enabled. This will ensures that there are no glitches on the output. The device monitors both DCS and CSR inputs and will gate the Qn, PPO1 (Paritial-Parity-Out) and PTYERR1# (Parity Error) Parity outputs from changing states when both DCS and CSR are high. If either DCS or CSR input is low, the Qn, PPO1 and PTYERR1# outputs will function normally. The RESET input has priority over the DCS and CSR controls and will force the Qn and PPO outputs low and the PTYERR1# high. The ICSSSTUA32S869B includes a parity checking function. The ICSSSTUA32S869B accepts a parity bit from the memory controller at its input pin PARIN1 one or two cycles after the corresponding data input, compares it with the data received on the D-inputs and indicates on its opendrain PTYERR1 pin (active low) whether a parity error has occurred. The number of cycles depends on the setting of C1, see Figure 6 and 7. When used as a single device, the C1 input is tied low. When used in pairs, the C1 inputs is tied low for the first register (front) and the C1 input is tied high for the second register. When used as a single register, the PPO1 and PTYERR1# signals are produced two clock cycles after the corresponding data input. When used in pairs, the PTYERR1# signals of the first register are left floating. The PPO1 outputs of the first register are cascaded to the PARIN1 signals on the second register (back). The PPO1 and PTYERR1# signals of the second register are produced three clock cycles after the corresponding data input. Parity implimentation and device wiring for single and dual die is described in Figure 1. If an error occurs, and the PTYERR1# is driven low, it stays low for two clock cycles or until RESET is driven low. The DIMM-dependent signals (DCKE, DCS, CSR and DODT) are not included in the parity check computations. All registers used on an individual DIMM must be of the same configuration, i.e single or dual die.
Parin1, W4 Parin PTYERR1# W1 Register 2 (Back) NC, A1 1
PPO1, W8 Register 1 (Front) NC, A4
Parin1, W4
.
NC, A8
.
NC, A8
Set C1 = 0 for Register 1; Set C1 = 1 for Register 2. NC denotes No Connect.
Figure 1 -- Parity implementation and device wiring for SSTU32S869 and SSTU32D869
1173--10/28/05
4
ICSSSTUA32S869B Advance Information
Terminal Functions
Signal Group Signal Name Type SSTL_18 SSTL_18 SSTL_18 Description DRAM function pins not associated with Chip Select. DRAM inputs, re-driven only when Chip Select is LOW. DRAM Chip Select signals. This pins initiate DRAM address/ command decodes, and as such at least one will be low when a valid address/command is present. Outputs of the register, valid after the specified clock count and immediately following a rising edge of the clock.
Ungated inputs DCKE, DODT Chip Select gated inputs Chip Select inputs Re-driven outputs D1 ... D14(1) DCS#, CSR#
Q1A...Q14A, SSTL_18 Q1B ... Q14B, QCSA#, QCSB# QCKEA,QCKEB QODTA,QODTB PARIN1 SSTL_18
Parity input
Inout parity is received on pin PARIN1 and should maintain (1) parity across the D1...D14 inputs, at the rising edge of the clock, one cycle after Chip Select is LOW. Partial Parity Output. Indicates parity out of D1-D14(1) When LOW, this output indicates that a parity error was identified associated with the address and/or command inputs. PTYERR1# will be active for two clock cycles, and delayed by in total 2 clock cycles for compatibility with final parity out timing on the industry-standard DDR2 register with parity (in JEDEC definition). When Low, register is configured as Register 1. When High, register is confugured as Register 2. Differential master clock input pair to the register. The register operation is triggered by a rising edge on the positive clock input (CK). Asynchronous reset input. When LOW, it causes a reset of the internal latches, thereby forcing the outputs LOW. RESET# also resets the PTYERR# signal.
Parity output Parity error output
PPO1 PTYERR1#
SSTL_18 Open drain
Configuration Inputs Clock inputs
C1 CK, CK#
1.8V LVCMOS SSTL_18
Miscellaneous inputs
RESET#
1.8 V LVCMOS
VREF VDD GND
0.9 V nominal Input reference voltage for the SSTL_18 inputs. Two pins (internally tied together) are used for increased reliability. Power Input Power supply voltage Ground Input Ground
NOTE 1 Inputs D1, D4 and D7 and their corresponding outputs Qn are not included in this range.
1173--10/28/05
5
ICSSSTUA32S869B Advance Information
Block Diagram
VREF
LSP0 internal node (CS Active) PARITY GENERATOR AND CHECKER PPO1
2 PARIN1 D 2 R
2
PTYERR1#
11
D1
D
Q1A
R
Q1B
D14
D
Q14A
R DCS# D
Q14B
QCSA#
R CSR#
QCSB#
DCKE
D
QCKEA
R
QCKEB
DODT
D
QODTA
R RESET# CK CK#
QODTB
1173--10/28/05
6
ICSSSTUA32S869B Advance Information
Block Diagram
RESET#
CLK CLK#
LPSO (Internal Node) D CLK
11
D2 - D3, D5 - D6, D8 - D14 VREF
D
CE
R
CE
CLK R D2 - D3, 11 D5 - D6, D8 - D14 Parity Check
D2 - D3, D5 - D6, D8 - D14 11
11
Q2A - Q3A, Q5A - Q6A, Q8A - Q14A Q2B - Q3B, Q5B - Q6B, Q8B - Q14B
11
0 D CLK R PAR_IN 1, PAR_IN 2 1 D CLK R CE
2 PTYERR 1, PTYERR 2 2 PPO 1,
PPO 2
2
C1, C2
CLK 2-Bit Counter R
0 D 1 CLK R
NOTE 2 PARIN 1 is used to generate PPO1 and PTYERR1#.
1173--10/28/05
7
ICSSSTUA32S869B Advance Information
Register Timing
RESET# DCS# CSR#
n n+1 n+2 n+3 n+4
CLK CLK#
tsu tH
D1 - D14
(1) tPD CLK to Q
Q1 - Q14
(1) tSU tH
PAR_IN1,(2) PAR_IN2,
tPD CLK to PPO
PPO1, PPO2
(2) tPD CLK to PTYERR# tPD CLK to PTYERR#
PTYERR1#,(2) PTYERR2#,
Note 1 This range doesn't include D1, D4 and D7 and their corresponding outputs
1173--10/28/05
8
ICSSSTUA32S869B Advance Information
Register Timing
RESET# DCS# CSR#
n n+1 n+2 n+3 n+4
CLK CLK#
tsu tH
D1 - D4
(1) tPD CLK to Q
Q1 - Q14 (1) PAR_IN1, PAR_IN2
(2) tSU tH
(not used)
PPO1, (2) PPO2
tPD CLK to PPO
PTYERR1#, (2) PTYERR2#
tPD CLK to PTYERR#
tPD CLK to PTYERR#
Note 1: This range doesn't include D1, D4 and D7 and their corresponding outputs
1173--10/28/05
9
ICSSSTUA32S869B Advance Information
Absolute Maximum Ratings
Storage Temperature . . . . . . . . . . . . . . . . . . . . Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . Input Voltage1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Output Voltage1,2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input Clamp Current . . . . . . . . . . . . . . . . . . . . Output Clamp Current . . . . . . . . . . . . . . . . . . . Continuous Output Current . . . . . . . . . . . . . . . VDDQ or GND Current/Pin . . . . . . . . . . . . . . . Package Thermal Impedance3
...............
-65C to +150C -0.5 to 2.5V -0.5 to VDD + 2.5V -0.5 to VDDQ + 0.5 50 mA 50mA 50mA 100mA 36C
Notes: 1. The input and output negative voltage ratings may be excluded if the input and output clamp ratings are observed. 2. This current will flow only when the output is in the high state level V0 >VDDQ. 3. The package thermal impedance is calculated in accordance with JESD 51.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only and functional operation of the device at these or any other conditions above those listed in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
Recommended Operating Conditions
PARAMETER V DD VREF VTT VI VIH (DC) VIH (AC) VIL (DC) VIL (DC) VIH VIL VICR VID IOH IOL TA
1
DESCRIPTION I/O Supply Voltage Reference Voltage Termination Voltage Input Voltage DC Input High Voltage AC Input High Voltage Data Inputs DC Input Low Voltage AC Input Low Voltage Input High Voltage Level RESET#, C0 Input Low Voltage Level Common mode Input Range CLK, CLK# Differential Input Voltage High-Level Output Current Low-Level Output Current Operating Free-Air Temperature
MIN TYP 1.7 1.8 0.49 x VDD 0.5 x VDD V REF - 0.04 VREF 0 VREF + 0.125 VREF + 0.250
MAX 1.9 0.51 x V DD VREF + 0.04 VDDQ
UNITS
VREF - 0.125 VREF - 0.250 0.65 x VDDQ 0.675 0.600 0.35 x VDDQ 1.125 -8 8 70
V
mA C
0
Guaranteed by design, not 100% tested in production. Note: Reset# and Cn inputs must be helf at valid logic levels (not floating) to ensure proper device operation. The differential inputs must not be floating unless Reset# is low.
Mode Select
C1
0 1
Device Mode
First Device in Pair, Front Second Device in Pair, Back
1173--10/28/05
10
ICSSSTUA32S869B Advance Information
Electrical Characteristics - DC
TA = 0 - 70C; V DD = 2.5 +/-0.2V, VDDQ=2.5 +/-0.2V; (unless otherwise stated) SYMBOL VIK V OH V OL II IDD PARAMETERS CONDITIONS VDDQ 1.7V 1.7V 1.7V 1.7V 1.9V 1.9V MIN VDDQ - 0.2 1.2 0.2 0.5 5 0.2 TBD TYP MAX -1.2 V UNITS I I = -18mA I OH = -100A I OH = 6mA I OL = 100A I OL = 6mA All Inputs V I = V DD or GND Standby (Static) RESET# = GND V I = V IH(AC) or VIL(AC), Operating (Static) RESET# = V DD RESET# = V DD, Dynamic operating V I = V IH(AC) or VIL(AC), (clock only) CLK and CLK# switching 50% duty cycle. IO = 0 RESET# = V DD, V I = V IH(AC) or VIL (AC), Dynamic Operating CLK and CLK# switching (per each data input) 50% duty cycle. One data input switching at half clock frequency, 50% duty cycle Input capacitance, V I = V REF 250 mV Dn, PAR_IN inputs Input capacitance, V I = V REF 250 mV DCS#n Input capacitance, V ICR = 0.9V; VI(PP) = 600 mV CK and CK# inputs 2 Input capacitance, V I = V DD or GND RESET# input Data Inputs V I = V REF 350mV CLK and CLK# V ICR = 1.25V, VI(PP) = 360mV V I = V DDQ or GND RESET#
A A mA
TBD
/clock MHz
I DDD
1.8V TBD A/ clock MHz/data
2.5 2 1.8V 2 Note 2 2.5 2 2.5
3.5 3 3 Note 2 3.5 3
pF pF pF pF pF
Ci
Notes: 1 - Guaranteed by design, not 100% tested in production. 2 - The vendor must supply this value for full device description.
Output Buffer Characteristics
Output edge rates over recommended operating free-air temperature range (See figure 7) VDD = 1.8V 0.1V UNIT PARAMETER MIN MAX dV/dt_r 1 4 V/ns dV/dt_f 1 4 V/ns 1 dV/dt_ 1 V/ns 1. Difference between dV/dt_r (rising edge rate) and dV/dt_f (falling edge rate)
1173--10/28/05
11
ICSSSTUA32S869B Advance Information
Timing Requirements
(over recommended operating free-air temperature range, unless otherwise noted) VDD = 1.8V 0.1V PARAMETERS SYMBOL MIN MAX Clock frequency 340 f clock tACT Differential inputs active time 10 t INACT Differential inputs inactive time 15 tS Setup time Data before CLK, CLK# 0.5 DCS0 before CLK, CLK#, 0.7 CSR# high DCS#, DODT, DCKE and Q Hold time 0.30 after CK, CK# tH PARIN1 after CK, CK# 0.30 Hold time 1 - Guaranteed by design, not 100% tested in production. Notes: 2 - For data signal input slew rate of 1V/ns. 3 - For data signal input slew rate of 0.5V/ns and < 1V/ns. 4 - CLK/CLK# signal input slew rate of 1V/ns. UNITS MHz ns ns ns ns ns
Switching Characteristics
(over recommended operating free-air temperature range, unless otherwise noted) Measurement Symbol Parameter MIN MAX Conditions fmax tPDM Max input clock frequency 340 1.2 1.2 1 1.9 3 3 2 3 3 Units MHz ns ns ns ns ns ns
Propagation delay, single CK to CK# QN bit switching Low to High propagation CK to CK# to tLH delay PTYERR# High to low propagation CK to CK# to tHL delay PTYERR# Propagation delay tPDMSS CK to CK# QN simultaneous switching High to low propagation tPHL RESET# to QN delay Low to High propagation RESET# to tPLH delay PTYERR1# 1. Guaranteed by design, not 100% tested in production.
1173--10/28/05
12
ICSSSTUA32S869B Advance Information
VDD
DUT td = 350ps TL =50 CK Inputs Test Point RL = 100 Test Point LVCMOS RESET# Inp ut t in act IDD (see Note 2) LOAD CIRCUIT VDD VDD/2 VDD/2 0V t act 90% 10% VOLTAGE AND CURRENT WAVEFORMS INPUTS ACTIVE AND INACTIVE TIMES tw Inpu t VICR VICR LVCMOS RST# Input VIH VDD /2 t RPHL t su Inpu t VREF th VREF VIH VOH Output VTT VOL VIL VID Output VTT V TT CK VICR CK t PLH t PHL VOH VOL VICR CK# CK TL=350ps, 50 Out CL = 30 pF (see Note 1) RL = 1000 Test Point RL = 1000
VID
VOLTAGE WAVEFORMS - PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS - PULSE DURATION VID CK VICR CK
VIL VOLTAGE WAVEFORMS - SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS - PROPAGATION DELAY TIMES
Figure 6 -- Parameter M easurement I nfor mation (V DD = 1.8 V 0.1 V)
Notes: 1. CL incluces probe and jig capacitance. 2. IDD tested with clock and data inputs held at VDD or GND, and Io = 0mA. 3. All input pulses are supplied by generators having the following chareacteristics: PRR 10 MHz, Zo=50, input slew rate = 1 V/ns 20% (unless otherwise specified). 4. The outputs are measured one at a time with one transition per measurement. 5. VREF = VDD/2 6. VIH = VREF + 250 mV (ac voltage levels) for differential inputs. VIH = VDD for LVCMOS input. 7. VIL = VREF - 250 mV (ac voltage levels) for differential inputs. VIL = GND for LVCMOS input. 8. VID = 600 mV 9. tPLH and tPHL are the same as tPDM.
1173--10/28/05
13
ICSSSTUA32S869B Advance Information
Output slew rate measurement information (VDD = 1.8 V 0.1 V)
All input pulses are supplied by generators having the following characteristics: PRR 10 MHz; Zo = 50 ; input slew rate = 1 V/ns 20%, unless otherwise specified.
VDD
DUT
RL = 50
OUT CL = 10 pF SEE NOTE (1)
TEST POINT
002aaa377
(1) CL includes probe and jig capacitance.
Figure 12 -- Load circuit, HIGH-to-LOW slew measurement
OUTPUT 80% dv_f 20% dt_f
VOH
VOL
002aaa378
Figure 13 -- Voltage waveforms, HIGH-to-LOW slew rate measurement
DUT
OUT CL = 10 pF SEE NOTE (1)
TEST POINT RL = 50
002aaa379
(1) CL includes probe and jig capacitance.
Figure 14 -- Load circuit, LOW-to-HIGH slew measurement
dt_r VOH 80% dv_r 20% OUTPUT VOL
002aaa380
Figure 15 -- Voltage waveforms, LOW-to-HIGH slew rate measurement
1173--10/28/05
14
ICSSSTUA32S869B Advance Information
Error output load circuit and voltage measurement information (VDD = 1.8 V 0.1 V)
All input pulses are supplied by generators having the following characteristics: PRR10 MHz; Zo = 50 ; input slew rate = 1 V/ns 20%, unless otherwise specified.
VDD DUT RL = 1 k OUT CL = 10 pF SEE NOTE (1)
002aaa500
TEST POINT
(1) CL includes probe and jig capacitance.
Figure 16 -- Load circuit, error output measurements
LVCMOS RESET Input
VCC VCC/2 0V tPLH VOH
Output Waveform 2
0.15 V
002aaa501
0V
Figure 17 -- Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to RESET# input
Timing Inputs
VICR
VICR
VI(PP)
tHL VCC Output Waveform 1 VCC/2 VOL
002aaa502
Figure 18 -- Voltage waveforms, open-drain output HIGH-to-LOW transition time with respect to clock inputs
Timing Inputs
VICR
VICR
VI(PP)
tLH VOH Output Waveform 2
0.15 V
002aaa503
0V
Figure 19 -- Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to clock inputs
1173--10/28/05
15
ICSSSTUA32S869B Advance Information
DUT
OUT CL=5pF See Note (1)
Testpoint RL=1K
(1) CL includes probe and jig capacitance.
Figure 22 -- Partial parity out load circuit
CK VICR CK tPLH tPHL VICR Vi(P-P)
VTT Output
VTT
VTT = VDD/2 VICR Cross Point Voltage Vi(P-P) = 600mV tPLH and tPHL are the same as tPD.
Figure 23 -- Partial parity out voltage waveform, propagation delay time with respect to CLK input
1173--10/28/05
16
ICSSSTUA32S869B Advance Information
d=
b
D
h=
E E1 T
D1
c
ALL DIMENSIO NS IN MILLIMETERS ----- BALL G RID ----D 13.00 Bs c E 8.00 Bsc T Min/Max 0.90/1.20 0.65 Bsc 11 19 150 e HORIZ VERT TO TAL d Min/Max 0.38/0.48 h Min/Max 0.27/0.37 11.70 Bs c 6.50 Bs c 0.65 0.75 *** D1 E1 REF. DIMS b c
Note: B all grid total indic ates max imum ball count for pack age. Les ser quantity may be used.
Ordering Information
ICSSSTUA32S869BH(LF)-T
Example:
ICS XXXX y H (LF)- T
Designation for tape and reel packaging Lead Free, RoHS Compliant (Optional) Package Type H = BGA Revision Designator (will not correlate with datasheet revision) Device Type Prefix ICS = Standard Device
1173--10/28/05
17
ICSSSTUA32S869B Advance Information
Revision History
Rev. 0.1 Issue Date Description 10/27/2005 Initial Release. Page # -
1173--10/28/05
18


▲Up To Search▲   

 
Price & Availability of ICSSSTUA32S869B

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X